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A semi-analytical decomposition analysis of surface plasmon generation and the optimal nanoledge plasmonic device

机译:表面等离子体产生的半分析分解分析和最优纳米冰柱装置

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Surface plasmon resonance (SPR) of nanostructured thin metal films (so-called nanoplasmonics) has attracted intense attention due to its versatility for optical sensing and chip-based device integration. Understanding the underlying physics and developing applications of nanoplasmonic devices with desirable optical properties, e.g. intensity of light scattering and high refractive index (RI) sensitivity at the perforated metal film, is crucial for practical uses in physics, biomedical detection, and environmental monitoring. This work presents a semi-analytical model that enables decomposition and quantitative analysis of surface plasmon generation at a new complex nanoledge aperture structure under plane-wave illumination, thus providing insight on how to optimize plasmonic devices for optimal plasmonic generation efficiencies and RI sensitivity. A factor analysis of parameters (geometric, dielectric-RI, and incident wavelength) relevant to surface plasmon generation is quantitatively investigated to predict the surface plasmon polariton (SPP) generation efficiency. In concert with the analytical treatment, a finite-difference time-domain (FDTD) simulation is used to model the optical transmission spectra and RI sensitivity as a function of the nanoledge device's geometric parameters, and it shows good agreement with the analytical model. Further validation of the analytical approach is provided by fabricating subwavelength nanoledge devices and testing their optical transmission and RI sensitivity.
机译:纳米结构薄金属薄膜(所谓的纳米甲型)的表面等离子体共振(SPR)由于其多功能性而引起了光学传感和基于芯片的设备集成的多功能性引起了强烈的关注。理解具有期望光学性质的底层物理学和开发纳米升性器件的应用,例如,光散射和高折射率(RI)灵敏度在穿孔金属膜上的灵敏度,对物理学,生物医学检测和环境监测的实际用途至关重要。该工作提出了一种半分析模型,可以在平面波照射下在新的复合纳米架孔径结构下进行分解和定量分析表面等离子体,从而为如何优化最佳等离子体发电效率和R 1灵敏度提供洞察力。定量地研究了与表面等离子体产生相关的参数(几何,电介质-RI和入射波长)的因子分析,以预测表面等离子体极谱(SPP)生成效率。在协会与分析处理中,有限差分时域(FDTD)模拟用于将光传输谱和RI灵敏度模拟为纳米指G设备的几何参数,它与分析模型显示出良好的一致性。通过制造子波长纳米指GED装置并测试它们的光学传输和RI灵敏度来提供分析方法的进一步验证。

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