首页> 外文期刊>ScientificWorldJournal >Development of Simple Designs of Multitip Probe Diagnostic Systems for RF Plasma Characterization
【24h】

Development of Simple Designs of Multitip Probe Diagnostic Systems for RF Plasma Characterization

机译:射频探针诊断系统简单设计的开发RF等离子体特征

获取原文
获取外文期刊封面目录资料

摘要

Multitip probes are very useful diagnostics for analyzing and controlling the physical phenomena occurring in low temperature discharge plasmas. However, DC biased probes often fail to perform well in processing plasmas. The objective of the work was to deduce simple designs of DC biased multitip probes for parametric study of radio frequency plasmas. For this purpose, symmetric double probe, asymmetric double probe, and symmetric triple probe diagnostic systems and their driving circuits were designed and tested in an inductively coupled plasma (ICP) generated by a 13.56 MHz radio frequency (RF) source. UsingI-Vcharacteristics of these probes, electron temperature, electron number density, and ion saturation current was measured as a function of input power and filling gas pressure. An increasing trend was noticed in electron temperature and electron number density for increasing input RF power whilst a decreasing trend was evident in these parameters when measured against filling gas pressure. In addition, the electron energy probability function (EEPF) was also studied by using an asymmetric double probe. These studies confirmed the non-Maxwellian nature of the EEPF and the presence of two groups of the energetic electrons at low filling gas pressures.
机译:MultiitIP探针是用于分析和控制低温放电等离子体中发生的物理现象的非常有用的诊断。然而,DC偏置探针通常在加工等离子体中经常表现良好。该工作的目的是推导出直流偏置多次多肝素探针的简单设计,用于射频等离子体的参数研究。为此目的,在由13.56MHz射频(RF)源产生的电感耦合的等离子体(ICP)中设计并测试了对称双探针,不对称双探针和对称三重探测诊断系统及其驱动电路。使用这些探针的vcheracteristics,电子温度,电子数密度和离子饱和电流作为输入功率和填充气体压力的函数。在电子温度和电子数密度中被注意到的增加趋势,用于增加输入的RF功率,而当测量填充气体压力时,这些参数中的降低趋势是显而易见的。此外,还通过使用不对称的双探针研究了电子能量概率函数(EEPF)。这些研究证实了EEPF的非最高领域性质以及在低填充气体压力下存在两组的能量电子。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号