A sensitive and robust thin-film x-ray detector using 2D layered perovskite diodes

摘要

Solid-state radiation detectors, using crystalline semiconductors to convert radiation photons to electrical charges, outperform other technologies with high detectivity and sensitivity. Here, we demonstrate a thin-film x-ray detector comprised with highly crystalline two-dimensional Ruddlesden-Popper phase layered perovskites fabricated in a fully depleted p - i-n architecture. It shows high diode resistivity of 10sup12/sup ohm·cm in reverse-bias regime leading to a high x-ray detecting sensitivity up to 0.276 C Gysubair/subsup?1/sup cmsup?3/sup. Such high signal is collected by the built-in potential underpinning operation of primary photocurrent device with robust operation. The detectors generate substantial x-ray photon–induced open-circuit voltages that offer an alternative detecting mechanism. Our findings suggest a new generation of x-ray detectors based on low-cost layered perovskite thin films for future x-ray imaging technologies.