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Local Berry curvature signatures in dichroic angle-resolved photoelectron spectroscopy from two-dimensional materials

机译:本地浆果曲率在二向角度分辨光电子能谱中的二维材料

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Topologically nontrivial two-dimensional materials hold great promise for next-generation optoelectronic applications. However, measuring the Hall or spin-Hall response is often a challenge and practically limited to the ground state. An experimental technique for tracing the topological character in a differential fashion would provide useful insights. In this work, we show that circular dichroism angle-resolved photoelectron spectroscopy provides a powerful tool that can resolve the topological and quantum-geometrical character in momentum space. In particular, we investigate how to map out the signatures of the momentum-resolved Berry curvature in two-dimensional materials by exploiting its intimate connection to the orbital polarization. A spin-resolved detection of the photoelectrons allows one to extend the approach to spin-Chern insulators. The present proposal can be extended to address topological properties in materials out of equilibrium in a time-resolved fashion.
机译:拓扑非竞争二维材料对下一代光电应用具有很大的承担。然而,测量大厅或旋转霍尔响应通常是挑战,实际上限于地位。以差分方式追踪拓扑角色的实验技术将提供有用的见解。在这项工作中,我们表明圆形二向角度解析光电子能谱提供了一种强大的工具,可以解决动量空间中的拓扑和量子几何特征。特别是,我们调查如何通过利用与轨道极化的密切相关来映射在二维材料中以二维材料解决的势头的签名。旋转分辨的光电子检测允许延伸到旋转切除绝缘体的方法。本提案可以扩展到以时间解决的方式在均衡超出均衡的材料中解决拓扑性质。

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