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Polymeric lithography editor: Editing lithographic errors with nanoporous polymeric probes

机译:聚合物光刻编辑器:用纳米多孔聚合物探针编辑光刻误差

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A new lithographic editing system with an ability to erase and rectify errors in microscale with real-time optical feedback is demonstrated. The erasing probe is a conically shaped hydrogel (tip size, ca. 500 nm) template-synthesized from track-etched conical glass wafers. The “nanosponge” hydrogel probe “erases” patterns by hydrating and absorbing molecules into a porous hydrogel matrix via diffusion analogous to a wet sponge. The presence of an interfacial liquid water layer between the hydrogel tip and the substrate during erasing enables frictionless, uninterrupted translation of the eraser on the substrate. The erasing capacity of the hydrogel is extremely high because of the large free volume of the hydrogel matrix. The fast frictionless translocation and interfacial hydration resulted in an extremely high erasing rate (~785 μm2/s), which is two to three orders of magnitude higher in comparison with the atomic force microscopy–based erasing (~0.1 μm2/s) experiments. The high precision and accuracy of the polymeric lithography editor (PLE) system stemmed from coupling piezoelectric actuators to an inverted optical microscope. Subsequently after erasing the patterns using agarose erasers, a polydimethylsiloxane probe fabricated from the same conical track-etched template was used to precisely redeposit molecules of interest at the erased spots. PLE also provides a continuous optical feedback throughout the entire molecular editing process—writing, erasing, and rewriting. To demonstrate its potential in device fabrication, we used PLE to electrochemically erase metallic copper thin film, forming an interdigitated array of microelectrodes for the fabrication of a functional microphotodetector device. High-throughput dot and line erasing, writing with the conical “wet nanosponge,” and continuous optical feedback make PLE complementary to the existing catalog of nanolithographic/microlithographic and three-dimensional printing techniques. This new PLE technique will potentially open up many new and exciting avenues in lithography, which remain unexplored due to the inherent limitations in error rectification capabilities of the existing lithographic techniques.
机译:通过具有实时光反馈的微尺度擦除和纠正微量光学反馈的新的印刷编辑系统。擦除探针是从轨道蚀刻的圆锥形玻璃晶片合成的锥形水凝胶(尖端尺寸,约500nm)。通过与湿海绵类似于湿海绵的扩散,通过将分子与湿海绵类似于湿海绵,将“纳米泊”水凝胶探针“擦除”图案。在擦除期间,水凝胶尖端和基板之间的界面液体水层的存在使得橡皮擦在基板上的无抗体,不间断地翻译。由于水凝胶基质的自由体积大,水凝胶的擦除能力极高。快速无摩擦易位和界面水合得到极高的擦除速率(〜785μm 2 / s),与基于原子力显微镜的擦除相比,这是两到三个数量级( 〜0.1μm 2 / s)实验。聚合物光刻编辑器(PLE)系统的高精度和精度源于耦合压电致动器到倒光学显微镜。随后在使用琼脂糖擦除器擦除图案之后,使用与相同的锥形轨道蚀刻模板制造的聚二甲基硅氧烷探针用于在擦除的斑点中精确重新浸入感兴趣的分子。 PLE在整个分子编辑过程写作,擦除和重写过程中也提供了连续的光学反馈。为了证明其在设备制造中的潜力,我们使用PLE到电化学擦除金属铜薄膜,形成用于制造功能性微光电原装置的互通的微电极阵列。高通量点和线擦除,用锥形“湿纳泊网”写作,连续光学反馈使PLE互补地与现有的纳米刻录/微光刻和三维印刷技术目录。这种新的PLE技术将潜在地在光刻中开辟许多新的和激动人心的途径,这仍然是由于现有光刻技术的误差整流能力的固有局限性而无法开发。

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