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An optimized fully-passive noise-shaping SAR ADC with integration capacitor reuse technique

机译:具有集成电容重用技术的优化全无源噪声整形SAR ADC

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This paper presents an optimized Fully-Passive Noise-Shaping Successive Approximation Register (FPNS-SAR) Analog-to-Digital Converter (ADC) with passive gain and integration capacitor reuse techniques. Instead of using multi-input-pair comparator with active gain in traditional Cascaded Integrator Feed-Forward (CIFF) structure, 1-input-pair comparator with passive gain is adopted in this paper to reduce power consumption and kick-back noise. The proposed FPNS-SAR ADC was implemented with standard 65-nm CMOS process. With the oversampling ratio (OSR) of 8, the simulation results realize 79.3dB peak SNDR and 94dB peak SFDR at 6.25MHz input signal bandwidth and 100MHz sampling frequency. The proposed ADC consumes 1.245mW at 1.2V supply voltage. The calculated FOMw and FOMs are 13.2fJ/conv.-step and 176.3dB, respectively.
机译:本文介绍了具有无源增益和集成电容器重用技术的优化的全动噪声整形举报(FPNS-SAR)模数转换器(ADC)。而不是在传统的级联积分器前馈(CIFF)结构中使用带有主动增益的多输入对比较器,本文采用了1输入对比较器,以降低功耗和返回噪声。所提出的FPNS-SAR ADC用标准的65nmCMOS工艺实施。通过825MHz输入信号带宽和100MHz采样频率,仿真结果为8,仿真结果实现了79.3dB峰值SNDR和94dB峰值SFDR。所提出的ADC在1.2V电源电压下消耗1.245MW。计算的FOMW和FOM分别为13.2FJ / CONV.-Step和176.3dB。

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