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High performance nBn detectors based on InGaAsSb bulk materials for short wavelength infrared detection

机译:基于InGaAssB散装材料的高性能NBN探测器,用于短波长射频检测

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We report a low dark current, high quantum efficiency nBn photodetectors based on Insub0.28/subGasub0.72/subAssub0.25/subSbsub0.75/sub bulk materials with a cut-off wavelength of 3μm at room temperature. Generation-Recombination current was suppressed using an nBn design to shift deplete region from Insub0.28/subGasub0.72/subAssub0.25/subSbsub0.75/sub active region into a wide band gap AlGaSb barrier region. The Arrhenius plots of Rsub0/subA-1/T show that there is no Generation-Recombination current detected in nBn device, whereas pin devices have a Generation-Recombination dominant dark current at temperatures ranging from 160K to 220K. Optical characterizations at 300K show the nBn device using InGaAsSb as an absorption material has a relative high quantum efficiency. The nBn device exhibits a peak specific detectivity of 4.8×10sup10/sup Jones under 200mV reverse bias voltage at 300K. The low dark current, high quantum efficiency and band gap tunability are expected to make InGaAsSb bulk material a competitive candidate for short wavelength infrared regime.
机译:我们报告了基于<亚> 0.28 0.72 的低暗电流,高量子效率NBN光电探测器,如 0.25 Sb 0.75 在室温下散装材料的截止波长为3μm。使用NBN设计抑制了生成 - 重组电流以将耗尽区域从 0.28 0.72 0.72 作为 0.25 sb 0.75 活动区域进入宽带隙allasb屏障区域。 R 0 a-1 / t的ARRHENIUS图表明,在NBN装置中没有检测到的一代重组电流,而引脚装置在160k至220k的温度下具有产生重组显性暗电流。 。 300K的光学表征显示使用InGAASSB作为吸收材料的NBN装置具有相对高量子效率。 NBN装置的峰值特定探测器为4.8×10 10 jones,在300k的200mV反向偏置电压下。预计低暗电流,高量子效率和带隙可调性将使Ingaassb散装材料成为短波长红外制度的竞争候选者。

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