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Adaptive Group-combined P-values Test for Two-sample Location Problem with Applications to Microarray Data

机译:适应性群组组合的P值测试对微阵列数据的应用程序的两个样本位置问题

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The purpose of this article is to propose a test for two-sample location problem in high-dimensional data. In general highdimensional case, the data dimension can be much larger than the sample size and the underlying distribution may be far from normal. Existing tests requiring explicit relationship between the data dimension and sample size or designed for multivariate normal distributions may lose power significantly and even yield type I error rates strayed from nominal levels. To overcome this issue, we propose an adaptive group p-values combination test which is robust against both high dimensionality and normality. Simulation studies show that the proposed test controls type I error rates correctly and outperforms some existing tests in most situations. An Ageing Human Brain Microarray data are used to further exemplify the method.
机译:本文的目的是在高维数据中提出对两个样本位置问题的测试。在一般的高度壳体中,数据维度可以大于样本大小,并且底层分布可能远非正常。需要在数据尺寸和样本大小或设计用于多变量正常分布的明确关系的现有测试可能会显着损失功率,甚至产生从名义级别误入的I型错误率。为了克服这个问题,我们提出了一种自适应组P值组合测试,其对高维度和正常性具有鲁棒性。仿真研究表明,所提出的测试控制I型错误速率正确,在大多数情况下占有一些现有测试。使用老化人脑微阵列数据来进一步举例说明该方法。

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