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Band-like transport in highly crystalline graphene films from defective graphene oxides

机译:带状在从有缺陷的石墨烯氧化物的高度结晶的石墨烯膜运输

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摘要

The electrical transport property of the reduced graphene oxide (rGO) thin-films synthesized from defective GO through thermal treatment in a reactive ethanol environment at high temperature above 1000?°C shows a band-like transport with small thermal activation energy (Ea~10?meV) that occurs during high carrier mobility (~210?cm(2)/Vs). Electrical and structural analysis using X-ray absorption fine structure, the valence band photo-electron, Raman spectra and transmission electron microscopy indicate that a high temperature process above 1000?°C in the ethanol environment leads to an extraordinary expansion of the conjugated π-electron system in rGO due to the efficient restoration of the graphitic structure. We reveal that Ea decreases with the increasing density of states near the Fermi level due to the expansion of the conjugated π-electron system in the rGO. This means that Ea corresponds to the energy gap between the top of the valence band and the bottom of the conduction band. The origin of the band-like transport can be explained by the carriers, which are more easily excited into the conduction band due to the decreasing energy gap with the expansion of the conjugated π-electron system in the rGO.
机译:在高于1000℃的高温下,从缺陷的缺陷型氧化物(RGO)薄膜的电气传递性能在高温高于1000℃的高温下进行热处理,显示出具有小的热激活能量的带状输送(EA〜10在高载流动性(〜210?cm(2)/ vs)期间发生的ev)。电气和结构分析使用X射线吸收细结构,价带光电,拉曼光谱和透射电子显微镜表明,在乙醇环境中高于1000℃以上的高温过程导致共轭π-的非凡扩展RGO中的电子系统由于石墨结构的有效修复。我们揭示EA随着在RGO中的共轭π电子系统的扩展而靠近费米水平附近的状态的增加。这意味着EA对应于价频带顶部和导带底部之间的能隙。载流子的起源可以由载体解释,该载体由于在RGO中的共轭π-电子系统的膨胀而降低的能量隙而更容易被激发到导电带中。

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