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Atomic layer confined vacancies for atomic-level insights into carbon dioxide electroreduction

机译:原子层限制了原子水平洞察二氧化碳电氧化碳的空位

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The role of oxygen vacancies in carbon dioxide electroreduction remains somewhat unclear. Here we construct a model of oxygen vacancies confined in atomic layer, taking the synthetic oxygen-deficient cobalt oxide single-unit-cell layers as an example. Density functional theory calculations demonstrate the main defect is the oxygen(II) vacancy, while X-ray absorption fine structure spectroscopy reveals their distinct oxygen vacancy concentrations. Proton transfer is theoretically/experimentally demonstrated to be a rate-limiting step, while energy calculations unveil that the presence of oxygen(II) vacancies lower the rate-limiting activation barrier from 0.51 to 0.40?eV via stabilizing the formate anion radical intermediate, confirmed by the lowered onset potential from 0.81 to 0.78?V and decreased Tafel slope from 48 to 37?mV?dec?1. Hence, vacancy-rich cobalt oxide single-unit-cell layers exhibit current densities of 2.7?mA?cm?2 with ca. 85% formate selectivity during 40-h tests. This work establishes a clear atomic-level correlation between oxygen vacancies and carbon dioxide electroreduction.
机译:氧空位在二氧化碳电氧化碳中的作用保持稍微不清楚。在这里,我们构建局限于原子层的氧空位模型,以合成的缺氧钴氧化物单单元 - 细胞层为例。密度函数理论计算证明主要缺陷是氧气(II)空位,而X射线吸收细结构光谱揭示了它们独特的氧空位浓度。理论上/实验证明质子转移是速率限制步骤,而能量计算推出氧气(ii)空位的存在从0.51至0.40的速率限制激活屏障通过稳定甲酸根部的基团中间体,确认通过降低的起始电位从0.81到0.78?V和从48到37°率下降到37.Δmv?dec ?1 。因此,富含空位的钴氧化物单单元 - 细胞层表现出电流密度为2.7?ma?cm 2 。 85%在40小时测试期间培养选择性。这项工作建立了氧空位和二氧化碳电化之间的明显原子水平相关性。

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