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Enhanced critical-current in P-doped BaFe2As2 thin films on metal substrates arising from poorly aligned grain boundaries

机译:金属衬底上的P掺杂BaFe2As2薄膜中由于晶界排列不正确而导致的临界电流增强

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Thin films of the iron-based superconductor BaFe2(As1-xPx)2 (Ba122:P) were fabricated on polycrystalline metal-tape substrates with two kinds of in-plane grain boundary alignments (well aligned (4°) and poorly aligned (8°)) by pulsed laser deposition. The poorly aligned substrate is not applicable to cuprate-coated conductors because the in-plane alignment 4° results in exponential decay of the critical current density (Jc). The Ba122:P film exhibited higher Jc at 4?K when grown on the poorly aligned substrate than on the well-aligned substrate even though the crystallinity was poorer. It was revealed that the misorientation angles of the poorly aligned samples were less than 6°, which are less than the critical angle of an iron-based superconductor, cobalt-doped BaFe2As2 (~9°), and the observed strong pinning in the Ba122:P is attributed to the high-density grain boundaries with the misorientation angles smaller than the critical angle. This result reveals a distinct advantage over cuprate-coated conductors because well-aligned metal-tape substrates are not necessary for practical applications of the iron-based superconductors.
机译:铁基超导体BaFe2(As1-xPx)2(Ba122:P)的薄膜在具有两种面内晶界排列(良好排列(4°)和不良排列(8))的多晶金属带基板上制备°))通过脉冲激光沉积。取向差的基板不适用于铜酸盐涂层的导体,因为面内取向> 4°会导致临界电流密度(Jc)呈指数衰减。即使在结晶度较差的情况下,在取向较差的基板上生长的Ba122:P膜在4?K处仍具有较高的Jc。结果表明,取向不良的样品的取向差角小于6°,小于铁基超导体,钴掺杂的BaFe2As2的临界角(〜9°),并且在Ba122中观察到强钉扎:P归因于取向错误角小于临界角的高密度晶界。该结果显示出优于铜酸盐涂覆的导体的显着优势,因为对于铁基超导体的实际应用而言,不需要良好排列的金属带基板。

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