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首页> 外文期刊>Scientific reports. >Suppressing the Fluorescence Blinking of Single Quantum Dots Encased in N-type Semiconductor Nanoparticles
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Suppressing the Fluorescence Blinking of Single Quantum Dots Encased in N-type Semiconductor Nanoparticles

机译:抑制N型半导体纳米粒子中包裹的单个量子点的荧光闪烁。

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N-type semiconductor indium tin oxide (ITO) nanoparticles are used to effectively suppress the fluorescence blinking of single near-infrared-emitting CdSeTe/ZnS core/shell quantum dots (QDs), where the ITO could block the electron transfer from excited QDs to trap states and facilitate more rapid regeneration of neutral QDs by back electron transfer. The average blinking rate of QDs is significantly reduced by more than an order of magnitude and the largest proportion of on-state is 98%, while the lifetime is not considerably reduced. Furthermore, an external electron transfer model is proposed to analyze the possible effect of radiative, nonradiative, and electron transfer pathways on fluorescence blinking. Theoretical analysis based on the model combined with measured results gives a quantitative insight into the blinking mechanism.
机译:N型半导体铟锡氧化物(ITO)纳米颗粒用于有效抑制单个近红外发射的CdSeTe / ZnS核/壳量子点(QD)的荧光闪烁,其中ITO可以阻止电子从受激QD转移到捕获态并通过反向电子转移促进中性量子点的更快再生。 QD的平均眨眼率显着降低了一个数量级以上,最大的接通状态比例为98%,而寿命并未显着降低。此外,提出了一个外部电子转移模型来分析辐射,非辐射和电子转移途径对荧光闪烁的可能影响。基于模型的理论分析与测量结果相结合,可以对闪烁机制进行定量分析。

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