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Magnetic and electric deflector spectrometers for ion emission analysis from laser generated plasma

机译:电磁偏转器光谱仪,用于从激光产生的等离子体中进行离子发射分析

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The pulsed laser-generated plasma in vacuum and at low and high intensities can be characterized using different physical diagnostics. The charge particles emission can be characterized using magnetic, electric and magnet-electrical spectrometers. Such on-line techniques are often based on time-of-flight (TOF) measurements. A 90° electric deflection system is employed as ion energy analyzer (IEA) acting as a filter of the mass-to-charge ratio of emitted ions towards a secondary electron multiplier. It determines the ion energy and charge state distributions. The measure of the ion and electron currents as a function of the mass-to-charge ratio can be also determined by a magnetic deflector spectrometer, using a magnetic field of the order of 0.35 T, orthogonal to the ion incident direction, and an array of little ion collectors (IC) at different angles. A Thomson parabola spectrometer, employing gaf-chromix as detector, permits to be employed for ion mass, energy and charge state recognition. Mass quadrupole spectrometry, based on radiofrequency electric field oscillations, can be employed to characterize the plasma ion emission. Measurements performed on plasma produced by different lasers, irradiation conditions and targets are presented and discussed. Complementary measurements, based on mass and optical spectroscopy, semiconductor detectors, fast CCD camera and Langmuir probes are also employed for the full plasma characterization. Simulation programs, such as SRIM, SREM, and COMSOL are employed for the charge particle recognition.
机译:可以使用不同的物理诊断方法来表征在真空中以及在低强度和高强度下的脉冲激光产生的等离子体。可以使用电磁,电和磁电光谱仪表征电荷粒子的发射。此类在线技术通常基于飞行时间(TOF)测量。 90°电偏转系统用作离子能量分析仪(IEA),用作朝着二次电子倍增器的已发射离子质荷比的过滤器。它确定离子能量和电荷状态分布。离子和电子电流作为质荷比的函数,也可以通过磁偏转光谱仪(使用与离子入射方向正交的0.35 T量级的磁场)和阵列来确定不同角度的少量离子收集器(IC)的数量。使用gaf-chromix作为检测器的Thomson抛物线光谱仪可用于离子质量,能量和电荷状态识别。基于射频电场振荡的质谱四极杆质谱可用于表征等离子体离子发射。介绍并讨论了对由不同激光,照射条件和目标产生的等离子体进行的测量。基于质谱和光谱学的补充测量,半导体检测器,快速CCD相机和Langmuir探针也用于完整的等离子体表征。仿真程序(例如SRIM,SREM和COMSOL)用于电荷粒子识别。

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