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XAFS studies of diluted magnetic semiconductor Mn-doped ZnSnAs2 thin films on InP substrates

机译:XPFS研究InP衬底上的稀磁半导体掺杂Mn的ZnSnAs2薄膜

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摘要

Mn-doped ZnSnAs2 (ZnSnAs2:Mn) thin films with 5.0 and 6.5% Mn composition were epitaxially grown by molecular beam epitaxy on InP (001) substrates. These films had a Curie temperature of 334 K, corresponding to room-temperature ferromagnetism. The local structures around Mn atoms in ZnSnAs2:Mn were studied by analysis of the X-ray absorption fine-structure spectra. It was found that the Mn atoms substitute into Zn or Sn cation sites, and the Mn?As bond length is 2.50 ?, which is slightly smaller than the value of 2.53 ? in a sphalerite (zinc-blende) ZnSnAs2 bulk crystal. The Mn?As bond length in ZnSnAs2:Mn is consistent with the value obtained from GaMnAs, and has a smaller value than that obtained from the zinc-blend MnAs thin films grown on a InP substrate.
机译:通过分子束外延在InP(001)衬底上外延生长Mn组成为5.0和6.5 %的Mn掺杂的ZnSnAs2(ZnSnAs2:Mn)薄膜。这些薄膜的居里温度为334 K,对应于室温铁磁性。通过分析X射线吸收精细结构光谱研究了ZnSnAs2:Mn中Mn原子周围的局部结构。结果发现,Mn原子取代了Zn或Sn阳离子部位,Mn 2 As的键长为2.50Ω,略小于2.53Ω。在闪锌矿(闪锌矿)ZnSnAs2块状晶体中。 ZnSnAs 2 ∶Mn中的Mn 2 As键长与从GaMnAs获得的值一致,并且比从在InP衬底上生长的锌混合MnAs薄膜获得的值小。

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