A Study of Dimensional Effect on Structural Properties of Cadmium Zinc Telluride Thin Films

摘要

In this work, thin films of Cd1-xZnxTe of 1μm and 100nm thickness are fabricated on plain glass substrates with ‘x’ varying from 0.0567 to 0.2210. Structural properties of these Cd1-xZnxTe 1μm and 100nm thin films are studied. The structural properties of these fabricated films are found to be functions of film thickness and ‘x’. The present paper has dealt with the estimation of dimensional effect on Cd1-xZnxTe thin films in the light of structural characterization studies.