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A Digital Twin for Integrated Inspection System in Digital Manufacturing

机译:用于数字制造的集成检查系统的数字孪生

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Coordinate metrology is a crucial part in advanced manufacturing industries to achieve and maintain conformance of high-quality products within design specifications. Meanwhile, software-components are increasingly becoming an essential part of the inspection process because of increasing part complexities in design and the high-volume of data captured from different sensors in hardware-components. This paper presents avirtual replicato work parallel to an integrated inspection system (IIS) for inspection of freeform and complex surfaces based on a metric of their geometric complexity. In this approach, an intelligently guided sampling is virtually conducted from a large dataset, instead of the physical sampling process when the sample points are traditionally selected randomly from the measured surface. Implementation of a closed-loop between the main tasks in IIS is considered in developing this digital twin to reduce the uncertainties associated with the inspection process. A method is introduced to estimate the local densities of the measured points required for virtual sampling from each patch on the work-pieces’s surface based on its geometric complexity. Two case studies are conducted to verify the effectiveness of the methodology. The observed efficiency in selection of the important measured data in the proposed sampling strategy makes it a better sampling strategy to be implemented in a digital twin for IISs.
机译:坐标计量是先进制造业中实现并保持设计规范内高质量产品一致性的关键部分。同时,由于设计中零件的复杂性增加以及从硬件组件中的不同传感器捕获的大量数据,软件组件正日益成为检查过程中必不可少的部分。本文介绍了一种虚拟副本,可与基于几何复杂度的自由形式和复杂表面的检查相集成的集成检查系统(IIS)并行工作。在这种方法中,当传统上从测量表面随机选择采样点时,实际上是从大型数据集中进行智能引导的采样,而不是物理采样过程。在开发此数字双胞胎时,考虑了在IIS中主要任务之间实施闭环,以减少与检查过程相关的不确定性。引入了一种方法,可以根据工件几何形状的复杂性,从工件表面上的每个贴片估算虚拟采样所需的测量点的局部密度。进行了两个案例研究,以验证该方法的有效性。在建议的采样策略中观察到的重要测量数据的选择效率很高,这使其成为在IIS的数字孪生系统中实施的更好的采样策略。

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