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首页> 外文期刊>Indian Journal of Science and Technology >Simulation and Characterization of Junction Less CMOS Inverter at Various Technology Nodes
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Simulation and Characterization of Junction Less CMOS Inverter at Various Technology Nodes

机译:不同技术节点的无结CMOS反相器的仿真和表征

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The simulation and drawing based on new type of technology namely junction less transistor technology CMOS inverter is discussed in this paper at various channel lengths. The transient curve, noise margin, various differences between conventional and junction less technology has been illustrated in this paper. The surface conduction and bulk conduction steps using visual TCAD is also expressed. The designing and fabrication steps along with the pros and cons have been characterized. The short channel parameter on which all other parameters directly or indirectly depends is calculated for both conventional and junction less transistor at different nodes. The noise margin and propagation delay at channel length 10nm, 20nm, 30nm and 40nm is calculated using TCAD simulation software. It has been found that CMOS inverter is giving best results when made using junction less technology.
机译:本文讨论了基于新型技术(即无结晶体管技术CMOS反相器)在不同通道长度下的仿真和绘图。本文说明了瞬态曲线,噪声容限,传统技术与无结技术之间的各种差异。还表示了使用可视化TCAD的表面传导和本体传导步骤。设计和制造步骤以及优点和缺点已被表征。对于其他节点处的常规晶体管和无结晶体管,都将计算所有其他参数直接或间接依赖的短通道参数。使用TCAD仿真软件计算了通道长度10nm,20nm,30nm和40nm处的噪声容限和传播延迟。已经发现,使用无结技术制造的CMOS反相器效果最佳。

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