首页> 外文期刊>Journal of the Magnetics Society of Japan >窒素イオン注入により作製したパタン媒体の再生信号解析によるパタン品質の評価
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窒素イオン注入により作製したパタン媒体の再生信号解析によるパタン品質の評価

机译:通过注入氮离子制备的图案介质的再生信号分析评估图案质量

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??Patterned media were fabricated by nitrogen ion implantation and changes of the pattern quality with ion energy were evaluated by analyzing the readback signals. The ion energies were 8, 12, 14 and 16 keV, and the dosage was 2.5×10~(16)ions/cm~(2). Auto correlation signal to noise ratio of DC-magnetized preamble pattern was maximized at 12 keV, though the saturation magnetization of the ion-implanted area was decreased as the ion energy increased throughout the range from 8 keV to 16 keV. 2D-maps of the signal amplitude showed larger fluctuation of the pattern shape for the ion energy of 16 keV than for the ion energy of 8 keV. The standard deviations of the pattern width were 4.3 nm and 8.4 nm for 8 keV and 16 keV, respectively, which were almost the same values as the standard deviations of calculated ion lateral distribution. The results indicate that some ions distributed under the mask by the ion lateral straggling and thus affected the pattern quality. For high quality patterning, ion lateral straggling needs to be suppressed by lowering ion energy.
机译:通过氮离子注入制造图案化的介质,并通过分析回读信号来评估图形质量随离子能量的变化。离子能量为8、12、14和16 keV,剂量为2.5×10〜(16)ions / cm〜(2)。尽管在离子能量从8 keV到16 keV的整个范围内增加时,离子注入区域的饱和磁化强度都降低了,但直流磁化的前同步码图案的自相关信噪比在12 keV时最大。信号幅度的二维图显示,对于16 keV的离子能量,其图形形状的波动要比对于8 keV的离子能量更大。对于8keV和16keV,图案宽度的标准偏差分别为4.3nm和8.4nm,这与所计算的离子横向分布的标准偏差几乎相同。结果表明,一些离子由于离子横向散布而在掩模下分布,从而影响了图形质量。为了获得高质量的图案,需要通过降低离子能量来抑制离子横向散乱。

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