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首页> 外文期刊>Journal of the Korean Institute of Electromagnetic Engineering and Science >Electrical Parameter Extraction of High Performance Package Using PEEC Method
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Electrical Parameter Extraction of High Performance Package Using PEEC Method

机译:用PEEC方法提取高性能包装的电参数

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This paper proposes a novel electrical characterization approach for a high-performance package system using an improved Partial Element Equivalent Circuit (PEEC). As the effect of interconnects becomes a pivotal factor for the performance of high-speed electronic systems, there is a great demand for an accurate equivalent model for interconnects. In particular, an equivalent model of interconnects is established in this paper for the Fine-Pitch Ball Grid Array (FBGA) package using the improved PEEC method. Based on the equivalent model, electrical characteristics are analyzed; furthermore, these are verified through the measurement results of a Vector Network Analyzer (VNA).
机译:本文提出了一种使用改进的部分元素等效电路(PEEC)的高性能封装系统的新颖电学表征方法。由于互连的影响成为影响高速电子系统性能的关键因素,因此迫切需要一种精确的互连等效模型。特别是,本文使用改进的PEEC方法为细间距球栅阵列(FBGA)封装建立了等效的互连模型。基于等效模型,分析电气特性;此外,这些通过矢量网络分析仪(VNA)的测量结果进行了验证。

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