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Two-Step LM Unit Root Tests with Trend-Breaks

机译:具有趋势断裂的两步LM单位根测试

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In this paper, we consider and examine the performance of two-step LM unit root tests with trend-breaks. In the first step, we jointly test for the existence and location of breaks using a maximum F-test. In the second step, we utilize the identified breaks and test for a unit root. A transformation procedure is adopted so that the tests with trend-breaks are invariant to nuisance parameters. We show that the two-step LM unit root tests have better properties of size and power than endogenous break unit root tests. In addition, the two-step test can be conveniently applied to allow for multiple breaks.
机译:在本文中,我们考虑并检验了带有趋势断裂的两步LM单位根检验的性能。第一步,我们使用最大F检验共同测试中断的存在和位置。在第二步中,我们利用确定的中断并测试单位根。采用转换程序,使具有趋势断裂的测试对于干扰参数不变。我们表明,与内生断裂单元根测试相比,两步LM单元根测试具有更好的尺寸和功率特性。此外,两步测试可以方便地应用以允许多次中断。

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