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首页> 外文期刊>Journal of Surface Analysis >Multimodal and in-situ Chemical Imaging of Critical Surfaces and Interfaces in Advanced Batteries
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Multimodal and in-situ Chemical Imaging of Critical Surfaces and Interfaces in Advanced Batteries

机译:先进电池中关键表面和界面的多模式和原位化学成像

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Interfaces play a critical role in the properties and lifetime of current generation and advanced batteries. However, detailed characterization of the critical interfaces during battery operation which can enable performance improvements and improved design has been a significant challenge requiring innovative technique development and creative experiments. This paper describes ways that information from a range of microscopy, spectroscopy, and spectrometry tools can be used to address important challenges associated with energy storage science and technology, in particular the development of advanced batteries for consumer use, transportation, and renewable storage. Expanding the types of measurements that can be made on operational model batteries has significantly expanded the type and quality of information that can be obtained. This paper first shows examples of approaches being used to collect in situ transmission electron microscopy (TEM), secondary ion mass spectrometry and x-ray photoelectron spectroscopy (XPS) data. The final section of the paper briefly shows two examples: the use of in situ XPS to examine solid-electrolyte interphase layers and a multimodal chemical imaging approach, including scanning TEM, atom probe tomography, scanning transmission x-ray microscopy, and x-ray adsorption near edge spectroscopy to understand the nanostructure and improve the performance of layered lithium transition metal oxide cathodes.
机译:接口在现代和高级电池的性能和寿命中起着至关重要的作用。然而,电池操作期间关键接口的详细表征(这可以实现性能改进和改进的设计)一直是一项重大挑战,需要创新的技术开发和创新的实验。本文介绍了各种显微镜,光谱学和光谱学工具中的信息可用于解决与储能科学和技术相关的重要挑战的方法,尤其是用于消费者使用,运输和可再生存储的高级电池的开发。扩展可在运行模型电池上进行的测量的类型已大大扩展了可获取信息的类型和质量。本文首先显示了用于收集原位透射电子显微镜(TEM),二次离子质谱和X射线光电子能谱(XPS)数据的方法示例。本文的最后一部分简要介绍了两个示例:使用原位XPS检查固体电解质相间层和多峰化学成像方法,包括扫描TEM,原子探针层析成像,扫描透射X射线显微镜和X射线吸附近缘光谱学,以了解纳米结构并改善层状锂过渡金属氧化物阴极的性能。

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