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首页> 外文期刊>Journal of Physics: Conference Series >Traceability of frequency based mass measurements using a quartz crystal microbalance
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Traceability of frequency based mass measurements using a quartz crystal microbalance

机译:使用石英晶体微量天平进行基于频率的质量测量的可追溯性

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The quartz crystal microbalance provides critical measurement capability for a wide variety of in situ and in vivo applications. However, it suffers from an underdeveloped connection to the SI (International System of Units). Here, a vacuum metal deposition system is used to deposit films of various masses on to the quartz crystals. The frequency change, which is proportional to the mass shift through the Sauerbrey equation, is compared to gravimetric based mass measurements using SI traceable mass artifacts.
机译:石英晶体微量天平为各种现场和体内应用提供了至关重要的测量能力。但是,它与SI(国际单位制)的联系欠发达。在此,使用真空金属沉积系统将各种质量的膜沉积到石英晶体上。将频率变化与通过Sauerbrey方程得出的质量位移成比例,然后将其与使用SI可追踪质量伪像的基于重量分析的质量测量进行比较。

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