首页> 外文期刊>Journal of Laser Micro/Nanoengineering >Growth of Nd:Gd3Ga5O12 Thin Films by Pulsed Laser Deposition for Planar Waveguide Laser
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Growth of Nd:Gd3Ga5O12 Thin Films by Pulsed Laser Deposition for Planar Waveguide Laser

机译:平面波导激光脉冲沉积法生长Nd:Gd 3 Ga 5 O 1 2 薄膜

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Pulsed laser radiation of a KrF excimer laser was used for the deposition of thin Nd3+ dopedGd3Ga5O12 (Nd:GGG) films on yttrium aluminium garnet (YAG) and sapphire single crystalsubstrates. By variation of PLD-parameters such as temperature and processing gas pressure,amorphous and single crystalline thin films were produced. The morphology and the composition ofthe grown films were investigated by optical microscopy, scanning electron microscopy andelectron dispersive X-ray spectroscopy. Thickness and structural properties of the deposited filmswere determined by optical reflection spectroscopy and X-ray diffraction, respectively. The opticalproperties of grown films on different substrates were compared. An amorphous Nd:Gd3Ga5O12 thinfilm on yttrium aluminium garnet was used for demonstration of an infrared waveguide laser. Aplanar wave guiding structure was formed in deposited film between two parallel groovesmicromachined using laser radiation delivered by a femtosecond CPA-Laser-System. The resultingwaveguides were polished and provided with resonator mirrors. With a 5% output coupler at 1064nm, a laser threshold of 1080 mW and 0.2% slope efficiency were obtained.
机译:KrF准分子激光的脉冲激光辐射用于在钇铝石榴石(YAG)和蓝宝石单晶衬底上沉积Nd3 +掺杂的Gd3Ga5O12(Nd:GGG)薄膜。通过改变温度和处理气压等PLD参数,可以生产出非晶和单晶薄膜。通过光学显微镜,扫描电子显微镜和电子色散X射线光谱研究了生长薄膜的形貌和组成。分别通过光学反射光谱和X射线衍射确定沉积膜的厚度和结构性质。比较了在不同基材上生长的薄膜的光学性质。钇铝石榴石上的非晶Nd:Gd3Ga5O12薄膜用于演示红外波导激光器。在飞秒CPA-Laser-System发射的激光辐射微加工而成的两个平行凹槽之间的沉积膜中形成了平面波导结构。所得到的波导被抛光并设有谐振镜。使用1064nm处的5%输出耦合器,可获得1080 mW的激光阈值和0.2%的斜率效率。

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