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首页> 外文期刊>Journal of healthcare engineering. >Accurate Rapid Lifetime Determination on Time-Gated FLIM Microscopy with Optical Sectioning
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Accurate Rapid Lifetime Determination on Time-Gated FLIM Microscopy with Optical Sectioning

机译:带有光学切片的时控FLIM显微镜可精确快速地确定使用寿命

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Time-gated fluorescence lifetime imaging microscopy (FLIM) is a powerful technique to assess the biochemistry of cells and tissues. When applied to living thick samples, it is hampered by the lack of optical sectioning and the need of acquiring many images for an accurate measurement of fluorescence lifetimes. Here, we report on the use of processing techniques to overcome these limitations, minimizing the acquisition time, while providing optical sectioning. We evaluated the application of the HiLo and the rapid lifetime determination (RLD) techniques for accurate measurement of fluorescence lifetimes with optical sectioning. HiLo provides optical sectioning by combining the high-frequency content from a standard image, obtained with uniform illumination, with the low-frequency content of a second image, acquired using structured illumination. Our results show that HiLo produces optical sectioning on thick samples without degrading the accuracy of the measured lifetimes. We also show that instrument response function (IRF) deconvolution can be applied with the RLD technique on HiLo images, improving greatly the accuracy of the measured lifetimes. These results open the possibility of using the RLD technique with pulsed diode laser sources to determine accurately fluorescence lifetimes in the subnanosecond range on thick multilayer samples, providing that offline processing is allowed.
机译:时间门控荧光寿命成像显微镜(FLIM)是评估细胞和组织生物化学的强大技术。当应用于厚实的样品时,由于缺少光学切片以及需要获取许多图像以精确测量荧光寿命而受到阻碍。在这里,我们报告了使用处理技术来克服这些限制,最大程度减少采集时间并提供光学切片的情况。我们评估了HiLo和快速寿命确定(RLD)技术在光学切片上精确测量荧光寿命的应用。 HiLo通过将来自标准图像的高频内容(使用均匀照明获得)与使用结构化照明获取的第二个图像的低频内容进行组合来提供光学切片。我们的结果表明,HiLo可在较厚的样品上进行光学切片,而不会降低测量寿命的准确性。我们还表明,仪器响应函数(IRF)反卷积可以与RLD技术一起应用于HiLo图像,从而大大提高了测量寿命的准确性。这些结果提供了将RLD技术与脉冲二极管激光源一起使用的可能性,前提是允许离线处理,从而可以精确确定亚纳秒范围内厚多层样品的荧光寿命。

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