New Possibilities for Investigation of the Technological Texture Based on Measurement of Electric Parameters: Theoretical Analysis and Experimental Verification

摘要

Texture is preferred orientation of crystallites in some polycrystalline materials. Different methods are applied to characterize the orientation patterns and determine the orientation distribution. Most of these methods rely on diffraction. This paper introduces the principle of a method used for characterization of ceramics texture based on anisotropy of electrical properties of crystallites in ceramics. The mathematical framework of this method is presented in theoretical part of our work. In experimental section we demonstrate how the theoretical result could be used to evaluate technology texture of ceramic material intended for the production of electronic insulators.