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首页> 外文期刊>Jordanian Journal of Computers and Information Technology >IMPROVED TESTABILITY METHOD FOR MESH-CONNECTED VLSI MULTIPROCESSORS
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IMPROVED TESTABILITY METHOD FOR MESH-CONNECTED VLSI MULTIPROCESSORS

机译:网格连接的VLSI多处理器的改进的可测试性方法

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摘要

The problem of in-operation embedded hardware-level fault detection in mesh-connected VLSI multiprocessors is considered. A new approach to the multiprocessor test based on the mutual inter-unit checking is presented, which allows increasing the successful fault detection probability. Formal rules are defined for forming sets of testing and tested neighbors for each unit which are invariant to the location of the unit within the topological structure of the multiprocessor and its dimension. The final test result for each processor unit is formed by applying the majority operator to the individual faulty/healthy tags calculated by all testing neighbors. The formulae to determine the number of testing neighbors for each unit depending on the dimension of the multiprocessor are given. The successful fault detection probability is evaluated in the case when the proposed approach is used; the successful fault detection probability vs. multiprocessor dimension and the successful fault detection probability vs. the individual test unit reliability dependencies are investigated. The proposed approach is shown to provide increased successful fault detection probability compared to the self-test for all practically significant cases.
机译:考虑了网状连接的VLSI多处理器中运行中嵌入式硬件级故障检测的问题。提出了一种基于相互单元间检查的多处理器测试新方法,该方法可以增加成功的故障检测概率。定义了用于形成每个单元的测试和被测试邻居的集合的形式规则,这些规则对于该单元在多处理器的拓扑结构及其尺寸内的位置是不变的。每个处理器单元的最终测试结果是通过将多数运算符应用于所有测试邻居计算出的单个故障/健康标签而形成的。给出了根据多处理器的尺寸确定每个单元的测试邻居数的公式。在使用建议的方法的情况下,评估成功的故障检测概率;研究了成功故障检测概率与多处理器尺寸之间的关系以及成功故障检测概率与各个测试单元可靠性之间的依赖关系。与所有实际重要情况下的自检相比,所提出的方法显示出能够提供更大的成功故障检测概率。

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