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SOM based Methodology for Evaluating Shrinkage Parameter of the Chip Developed in Titanium Dry Turning Process

机译:基于SOM的钛干车削芯片收缩参数评估方法。

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摘要

In the most of machining processes, chip morphology and microstructure contain deep information about the cutting mechanisms, their evolution and, even, about both the process and the workpiece. However, usually, changes in the process are related only to changes in the tool morphology and in the surface integrity hiding relevant information. This is commonly due to the chip characterization is not an easy task. In effect, chip geometry and dimensional features are habitually hardly measurable and evaluable. In this work, a methodology for characterizing the chip developed in the dry turning processes of Titanium alloys (Ti6Al4V - UNS R56400) has been proposed. This characterization has been achieved by considering different geometrical and dimensional parameters. Thus, shrinkage parameter has been evaluated through the changes in length and compared with the corresponding values determined through variations measured in thickness and width. However, the partially discontinuous form of the Ti chips makes difficult the dimensional evaluation. Stereoscopic Optical Microscopy (SOM) techniques can help to evaluate the chip shrinkage parameter through the measurement of the shear angle. In parallel, SOM techniques can assist for measuring other geometrical parameters of the chip. In this context, the evolution of the shrinkage parameter with the length of machining and the changes of the chip geometry with the cutting parameters (cutting speed and feed) has been also analyzed.
机译:在大多数加工过程中,切屑的形态和微观结构都包含有关切削机理,其演变以及甚至过程和工件的深层信息。但是,通常,过程中的更改仅与工具形态和隐藏相关信息的表面完整性方面的更改有关。这通常是由于芯片表征并非易事。实际上,习惯上很难测量和评估芯片的几何形状和尺寸特征。在这项工作中,提出了一种表征在钛合金干式车削工艺(Ti6Al4V-UNS R56400)中开发的切屑的方法。通过考虑不同的几何和尺寸参数可以实现这种表征。因此,已经通过长度的变化评估了收缩参数,并将其与通过厚度和宽度的变化所确定的相应值进行了比较。然而,Ti芯片的部分不连续形式使得尺寸评估困难。立体光学显微镜(SOM)技术可通过测量剪切角来帮助评估切屑收缩参数。同时,SOM技术可以帮助测量芯片的其他几何参数。在这种情况下,还分析了收缩参数随加工时间的变化以及切屑几何形状随切削参数(切削速度和进给)的变化。

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