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High-Speed Algorithm for Shielding Current Analysis in HTS Film with Cracks

机译:含裂纹的HTS膜中屏蔽电流分析的高速算法

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A fast and stable method is proposed for calculating the time-varying shielding current density in a high-temperature superconducting (HTS) film containing cracks. If an initial-boundary-value problem of the shielding current density is formulated by the T -method, integral forms of Faraday's law on crack surfaces are also imposed as boundary conditions. As a result of the spatial discretization of the initial-boundary-value problem, semi-explicit differential algebraic equations (DAEs) are obtained. Although the DAEs can be solved with standard ordinary-differential-equation (ODE) solvers, much CPU time is required for their numerical solution. In order to shorten the CPU time, the following high-speed algorithm is proposed: the block LU decomposition is incorporated into function evaluations in ODE solvers. A numerical code is developed on the basis of the proposed algorithm and detectability of cracks by the scanning permanent-magnet method is numerically investigated. The results of computations show that, when multiple cracks is contained in an HTS film, resolution of the scanning permanent-magnet method will be degraded remarkably.
机译:提出了一种快速稳定的方法来计算含裂纹的高温超导(HTS)膜中随时间变化的屏蔽电流密度。如果通过T-方法来确定屏蔽电流密度的初始边界值问题,则裂纹表面上的法拉第定律的积分形式也将作为边界条件。作为初始边界值问题的空间离散化的结果,获得了半显式微分代数方程(DAE)。虽然DAE可以使用标准的常微分方程(ODE)求解器进行求解,但其数值求解需要大量的CPU时间。为了缩短CPU时间,提出了以下高速算法:将块LU分解纳入ODE求解器的功能评估中。在提出的算法的基础上,开发了一个数字代码,并通过扫描永磁方法对裂纹的可检测性进行了数值研究。计算结果表明,在高温超导薄膜中包含多个裂纹时,扫描永磁法的分辨率会明显下降。

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