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Effect of double frequency heating on the lead afterglow beam currents of an electron cyclotron resonance ion source

机译:双频加热对电子回旋共振离子源铅余辉束电流的影响

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The effect of double frequency heating on the performance of the CERN GTS-LHC 14.5 GHz Electron Cyclotron Resonance (ECR) ion source in afterglow mode is reported. The source of the secondary microwave frequency was operated both in pulsed and continuous wave (CW) modes within the range of 12--18 GHz. The results demonstrate that the addition of the secondary frequency can significantly impact the extracted beam currents and the temporal stability of the beam during the afterglow discharge. For example, up to a factor of 2.6 increase was achieved for ${^{208}mathrm{Pb}}^{35+}$ and a factor of 3.1 for ${^{208}mathrm{Pb}}^{37+}$ compared to single frequency afterglow currents. It is shown that these effects are dependent on the choice of the secondary frequency with respect to the primary one and on the temporal synchronization between the two microwave sources. Overall, the results provide new insight into the afterglow discharge supporting the prevailing understanding of the physical processes behind the phenomenon.
机译:据报道,在余辉模式下,双频加热对CERN GTS-LHC 14.5 GHz电子回旋共振(ECR)离子源性能的影响。次级微波频率源在12--18 GHz范围内以脉冲和连续波(CW)模式工作。结果表明,在余辉放电期间,次级频率的增加会显着影响提取的电子束电流和电子束的时间稳定性。例如,$ {^ {208} mathrm {Pb}} ^ {35 +} $的系数提高到2.6,而$ {^ {208} mathrm {Pb}} ^的系数提高到3.1。 {37 +} $与单频余辉电流相比。结果表明,这些影响取决于相对于初级频率的次级频率的选择以及两个微波源之间的时间同步。总体而言,结果提供了对余辉排放的新见识,支持了对现象背后物理过程的普遍理解。

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