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首页> 外文期刊>Results in Physics >Electronic band structure of InAs/InAsSb type-II superlattice for HOT LWIR detectors
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Electronic band structure of InAs/InAsSb type-II superlattice for HOT LWIR detectors

机译:HOT LWIR探测器的InAs / InAsSb II型超晶格的电子能带结构

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摘要

The InAs/InAs1?xSbxtype-II superlattices (T2SLs) grown on GaSb buffer layer and GaAs substrates have recently been applied for detectors for long wavelength infrared (LWIR) range and high operating temperature (HOT) conditions. The detailed modeling of T2SLs minibands structure required for detector’s design optimization process relies on accurate knowledge of the InAs1?xSbxbandgap and band edge position. The k?p (8?×?8 method) was used to analyze the valence band offset (VBO) between InAs and InAs1?xSbx, and hence the InAs1?xSbxband edge position at requiredxSbcomposition. An increase of the VBO leads to the structure transformation from type-IIb to type-II superlattices. The required energy bandgap can be reached by changing the conduction band offset (CBO) and the energy bandgap bowing parameter. The temperature dependence of the experimental results of InAs/InAs1?xSbxT2SLs energy bandgap was found to be comparable with theoretical one when energy bandgap bowing parameter is dependent on temperature. The proper fitting of theoretically calculated and experimentally measured spectral response characteristics was shown.
机译:在GaSb缓冲层和GaAs衬底上生长的InAs / InAs1?xSbxtype-II超晶格(T2SLs)最近已用于长波长红外(LWIR)范围和高工作温度(HOT)条件的探测器。检测器设计优化过程所需的T2SL微型带结构的详细建模依赖于InAs1?xSbxbandgap和带边缘位置的准确知识。使用k?p(8?×?8方法)分析InAs与InAs1?xSbx之间的价带偏移(VBO),从而分析所需xSb组成处的InAs1?xSbx能带边缘位置。 VBO的增加导致结构从IIb型转变为II型超晶格。可以通过改变导带偏移(CBO)和能带隙弯曲参数来达到所需的能带隙。当能带隙弯曲参数取决于温度时,InAs / InAs1?xSbxT2SLs能带隙的实验结果与温度的关系可与理论值相媲美。显示了理论计算和实验测量的光谱响应特性的正确拟合。

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