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Deuterium retention in the divertor tiles of JET ITER-Like wall

机译:氘在JET ITER样墙的偏滤器瓦中的保留

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Highlights ? D concentrations were determined for the JET ILW-2 divertor tiles with SIMS. ? The highest concentrations (~8?·?10 18 D/cm 2 ) were found on the upper inner divertor. ? D retention is generally higher for ILW-2 divertor tiles than after ILW-1 campaign. ? Difference is related to longer exposure of some tiles and changes in SP-distribution. Abstract Divertor tiles removed after the second JET ITER-Like Wall campaign 2013–2014 (ILW-2) were studied using Secondary Ion Mass Spectrometry (SIMS). Measurements show that the thickest beryllium (Be) dominated deposition layers are located at the upper part of the inner divertor and are up to ~40μm thick at the lower part of Tile 0 exposed in 2011–2014. The highest deuterium (D) amounts (>8?·?10 18 at./cm 2 ), in contrast, were found on the upper part of Tile 1 (2013–2014), where the Be deposits are ~10μm thick. D was mainly retained in the near-surface layer of the Be deposits but also deeper in tungsten (W) and molybdenum (Mo) layers of the marker coated tiles, especially at W–Mo layer interfaces. D retention for the ILW-2 divertor tiles is higher than for the first campaign 2011–2012 (ILW-1) and probable reason s for the difference are that SIMS measurements for the ILW-2 samples were done deeper than for the ILW-1 samples, some of the tiles were exposed during both ILW-1 and ILW-2 and therefore had a longer exposure time, and the differences between ILW-1 and ILW-2 campaigns e.g. in strike point distributions and injected powers.
机译:强调 ?使用SIMS确定JET ILW-2偏滤器瓦的D浓度。 ?在上部内分流器上发现最高浓度(〜8?·?10 18 D / cm 2)。 ?与ILW-1战役之后相比,ILW-2偏滤器瓦的D保留通常更高。 ?差异与某些磁贴的更长曝光时间和SP分布的变化有关。摘要使用二次离子质谱仪(SIMS)研究了在第二次JET ITER样墙运动2013–2014(ILW-2)之后移除的分流板。测量表明,最厚的铍(Be)为主的沉积层位于内部偏滤器的上部,在2011-2014年暴露的Tile 0的下部的厚度高达〜40μm。相比之下,最高的氘(D)量(> 8?·?10 18 at./cm 2)发现于1号瓷砖(2013-2014年)的上部,Be沉积物的厚度约为10μm。 D主要保留在Be沉积物的近表层中,但也更深地保留在标记涂层砖的钨(W)和钼(Mo)层中,特别是在W-Mo层界面处。 ILW-2偏滤片的D保留率高于2011-2012年第一个战役(ILW-1)的保留率,可能的原因是ILW-2样品的SIMS测量比ILW-1更深样本中,某些瓷砖在ILW-1和ILW-2期间均暴露,因此具有更长的暴露时间,并且ILW-1和ILW-2运动之间的差异例如在打击点分布和注入的力量。

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