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首页> 外文期刊>Nuclear Materials and Energy >Initial studies of plasma facing component surface conditioning in the national spherical tokamak experiment upgrade with the materials analysis particle probe
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Initial studies of plasma facing component surface conditioning in the national spherical tokamak experiment upgrade with the materials analysis particle probe

机译:用材料分析粒子探针在国家球形托卡马克实验升级中对等离子体面对部件表面处理的初步研究

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Highlights ? In vacuo analysis of plasma facing components in a tokamak is reported for the first time. ? Coatings deposited during boronization in NSTX-U were found to be B 4 C. ? XPS data reveal oxidation and erosion of B 4 C coatings exposed to D + plasmas. ? The MAPP facility was proven to be a powerful surface diagnostic for tokamak machines. Abstract An innovative PFC diagnostic, the Materials Analysis Particle Probe (MAPP) was used to study the chemistry of Plasma Facing Components (PFCs) in the National Spherical Tokamak Experiment Upgrade (NSTX-U). NSTX-U used boronization as conditioning strategy during the 2015–2016 experimental campaign. Deposition with ~9.1g of deuterated tri-methyl boron (d-TMB) in a helium glow discharge resulted in coatings with an equivalent thickness of 7.0nm at the lower outer divertor region. MAPP was used to capture for the first time the in-vacuo evolution of the chemical state of ATJ graphite PFCs after boronization and plasma exposure via X-ray Photoelectron Spectroscopy (XPS) on a day-to-day basis. The XPS data shows the formation of B 4 C on the PFCs surface during boronization. We observed the gradual increase of the B 2 O 3 fraction in the coatings with plasma exposures. In contrast, we measured the formation of non-stoichiometric oxides when the samples were only exposed to residual gases and an argon vent. MAPP data revealed erosion and oxidation of deposited boron coatings over the course of tens of shots (a time resolution improved several orders-of-magnitude compared to post-campaign PFC characterization) that is correlated with the transitory nature of plasma performance enhancement with boron conditioning.
机译:强调 ?真空中首次报道了托卡马克中面向血浆的组分的分析。 ?发现在硼化期间在NSTX-U中沉积的涂层为B 4C。 XPS数据显示暴露于D +等离子体的B 4 C涂层的氧化和腐蚀。 ?事实证明,MAPP设备可为托卡马克机器提供强大的表面诊断功能。摘要在国家球形托卡马克实验升级(NSTX-U)中,使用一种创新的PFC诊断材料分析颗粒探针(MAPP)研究了面向等离子体的组分(PFC)的化学性质。在2015–2016年的实验活动中,NSTX-U使用硼化作为调节策略。在氦辉光放电中用约9.1g氘代三甲基硼(d-TMB)进行沉积,导致在下部外部偏滤器区域的等效厚度为7.0nm。 MAPP每天第一次通过X射线光电子能谱(XPS)捕获硼化和等离子体暴露后ATJ石墨PFC的化学状态的首次真空捕获。 XPS数据显示了硼化过程中PFC表面上B 4 C的形成。我们观察到随着等离子体暴露,涂层中的B 2 O 3含量逐渐增加。相反,当样品仅暴露于残留气体和氩气排放口时,我们测量了非化学计量氧化物的形成。 MAPP数据显示,在数十次枪击过程中,沉积的硼涂层受到腐蚀和氧化(与运动后PFC表征相比,时间分辨率提高了几个数量级),这与通过硼调节提高等离子体性能的短暂性相关。

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