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Amorphous Silicon Nanowires Grown on Silicon Oxide Film by Annealing

机译:通过退火在氧化硅膜上生长的非晶硅纳米线

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In this paper, amorphous silicon nanowires (α-SiNWs) were synthesized on (100) Si substrate with silicon oxide film by Cu catalyst-driven solid-liquid-solid mechanism (SLS) during annealing process (1080?°C for 30?min under Ar/H~(2) atmosphere). Micro size Cu pattern fabrication decided whether α-SiNWs can grow or not. Meanwhile, those micro size Cu patterns also controlled the position and density of wires. During the annealing process, Cu pattern reacted with SiO~(2) to form Cu silicide. More important, a diffusion channel was opened for Si atoms to synthesis α-SiNWs. What is more, the size of α-SiNWs was simply controlled by the annealing time. The length of wire was increased with annealing time. However, the diameter showed the opposite tendency. The room temperature resistivity of the nanowire was about 2.1?×?10_(3)?Ω·cm (84?nm diameter and 21?μm length). This simple fabrication method makes application of α-SiNWs become possible.
机译:在本文中,在退火过程中(1080?C持续30?min),通过Cu催化剂驱动的固液固机理(SLS)在具有氧化硅膜的(100)Si衬底上合成了非晶硅纳米线(α-SiNWs)。在Ar / H〜(2)气氛下)。微米尺寸的铜图案制造决定了α-SiNWs是否可以生长。同时,那些微小尺寸的铜图案也控制了导线的位置和密度。在退火过程中,Cu图案与SiO〜(2)反应形成硅化铜。更重要的是,为Si原子打开了一条扩散通道,以合成α-SiNWs。此外,α-SiNWs的大小仅受退火时间控制。焊丝的长度随着退火时间的增加而增加。但是,直径显示出相反的趋势。纳米线的室温电阻率约为2.1Ω×Ω10_(3)ΩΩ·cm(直径84nm,长度21μm)。这种简单的制造方法使得α-SiNW的应用成为可能。

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