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Bending Limit Tests for Ultra-Thin Liquid Crystal Polymer Substrate Based on Flexible Microwave Components

机译:基于柔性微波组件的超薄液晶聚合物基板的弯曲极限测试

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In this paper, bending limit tests for one ultra-thin liquid crystal polymer (LCP) substrate (Rogers 3850) based on the mechanical properties of flexible microwave microstrip components are presented. First, a set of 50 Ω microstrip lines, a band-pass filter, and a stepped impedance filter in X-band, are designed by using double clapped LCPs with 50 μm thickness of substrate and 18 μm thickness of copper, which is fabricated by conventional photolithography. Then, the limit tests of the flexibility of the LCP microwave microstrip components are presented, and the range of the bending limit radius, from 1 mm to 0.75 mm, is demonstrated from the testing results. It is found that the cause for component failure is fracture of the copper (18 μm thickness) laminate, according to the bending limit test experiments. Finally, the analysis of the reasons for the collapse of the microwave components, under bending situations, is explored. The results from this work would be useful for further designs of the flexible microwave devices and systems on LCP substrates, with compact sizes and good performance.
机译:本文基于柔性微波微带元件的机械性能,提出了一种超薄液晶聚合物(LCP)基板(Rogers 3850)的弯曲极限测试。首先,通过使用厚度为50μm的基板和18μm的铜的双包LCP设计了一组50Ω微带线,一个带通滤波器和一个X波段的步进阻抗滤波器,该LCP通过以下方法制造:常规光刻。然后,对LCP微波微带元件的柔韧性进行了极限测试,并从测试结果证明了弯曲极限半径的范围为1 mm至0.75 mm。根据弯曲极限测试实验,发现导致组件故障的原因是铜(厚度为18μm)层压板的断裂。最后,探讨了在弯曲情况下微波分量崩溃的原因。这项工作的结果对于在LCP基板上的柔性微波装置和系统的进一步设计(具有紧凑的尺寸和良好的性能)将是有用的。

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