首页> 外文期刊>International Journal on Smart Sensing and Intelligent Systems >WAVLET-BASED ACTIVE SENSING FOR HEALTH MONITORING OF PLATE STRUCTURES USING BASELINE FREE ULTRASONIC GUIDED WAVE SIGNALS
【24h】

WAVLET-BASED ACTIVE SENSING FOR HEALTH MONITORING OF PLATE STRUCTURES USING BASELINE FREE ULTRASONIC GUIDED WAVE SIGNALS

机译:基于基线的免费超声波引导波信号基于小波的主动监测板结构健康

获取原文
           

摘要

A wavelet-based active sensing technique for health monitoring of isotropic thin plate-likestructures using baseline-free ultrasonic guided Lamb wave signals is presented. In this technique, abuilt in clock-like piezoelectric (PZT) wafer array of small footprint comprising of a single transmitterand multi-receivers (STMR) is considered. The recorded signals in absence of defects are comparedwith a theoretical model first, and the velocity and amplitude dispersion of guided waves are studied inan effort to tune an appropriate guided wave mode. A five cycle Hanning pulse is transmitted, and thepulse-echo data recorded at the receivers is processed using two novel algorithms, namely damageindex 1 (DI1) and damage index 2 (DI2), based on wavelet transformation to identify defects in theform of cracks and loose rivet holes, which are located both near and far away from the array. In bothcases, damage index (DI) maps are generated for identification of defects in a particular coverage areaon demand by considering the reflected fundamental guided wave modes. Simulation studies are also carried out to demonstrate the effectiveness of the proposed sensing technique. The DI maps clearlyshow higher values of DI at defect locations enabling identification of multiple defects. The DI2 isfound to produce better angular resolution of the defect location than the DI1.
机译:提出了一种基于小波的主动传感技术,利用无基线超声导引的兰姆波信号对各向同性薄板状结构进行健康监测。在这种技术中,考虑了由单个发射器和多个接收器(STMR)组成的,占地面积小的内置时钟状压电(PZT)晶片阵列。首先将没有缺陷的记录信号与理论模型进行比较,并研究导波的速度和振幅色散,以调整合适的导波模式。发射五个周期的汉宁脉冲,并基于小波变换,使用小波变换来识别裂缝和裂纹的缺陷,使用两种新颖的算法,即损伤指数1(DI1)和损伤指数2(DI2)处理接收器处记录的脉冲回波数据。松散的铆钉孔,它们位于阵列附近和远离阵列。在这两种情况下,都会通过考虑反射的基本导波模式来生成损坏指数(DI)图,以根据需要识别特定覆盖区域中的缺陷。还进行了仿真研究,以证明所提出的传感技术的有效性。 DI图清楚地显示了在缺陷位置处更高的DI值,从而能够识别多个缺陷。发现DI2比DI1产生更好的缺陷位置角分辨率。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号