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首页> 外文期刊>International Journal of Scientific & Technology Research >Implication Of X-Ray Path, Region Of Interest, Tube Current And Voltage In Calibration Of X-Ray Fluorescence Instrument: A Case Study Of X-Supreme 8000
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Implication Of X-Ray Path, Region Of Interest, Tube Current And Voltage In Calibration Of X-Ray Fluorescence Instrument: A Case Study Of X-Supreme 8000

机译:X射线荧光仪校准中X射线路径,感兴趣区域,管电流和电压的含义:以X-Supreme 8000为例

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摘要

Abstract: This report unveils the measures taken to calibrate the newly installed x-ray fluorescence instrument (X-Supreme 8000) in Multi-User Science Research Laboratory, Ahmadu Bello University, Zaria. Precision and accuracy is dependent on appropriate method set up and suitable analyte conditions. The tube current was set to achieve 20% dead time for silicon drift detector (SDD). The tube voltage setting with at least twice line energy of elements aided method set up for spectrum scan from which region of interest (ROI) was utilized to check interferences and matrix effect. Air readily absorb low energy x-ray, thus the analysis chamber was evacuated with helium for low Z elements up to Niobium (Nb). Direct proportional relationships occur between concentration of analytes and detector count per seconds (cps). The standard error of mean of given and calculated concentration of standard reference materials (SRM) range between 0.001 ' 0.013wt%. A relatively low standard deviation and repeatability of results confirms good precision and accuracy of the instrument.
机译:摘要:本报告介绍了在扎里亚阿哈马杜贝洛大学多用户科学研究实验室中用于校准新安装的X射线荧光仪器(X-Supreme 8000)的措施。精度和准确性取决于适当的方法设置和适当的分析物条件。管电流设置为实现硅漂移检测器(SDD)的20%死区时间。具有至少两倍元素线能量的管电压设置有助于建立光谱扫描方法,从该区域利用感兴趣区域(ROI)检查干扰和基质效应。空气容易吸收低能量的X射线,因此将氦气抽空到低N元素至铌(Nb)的分析室中。直接的比例关系出现在分析物的浓度与检测器每秒计数(cps)之间。标准参考物质(SRM)的给定浓度和计算浓度的平均值的标准误差范围为0.001'0.013wt%。相对较低的标准偏差和结果可重复性证实了仪器的良好精度和准确性。

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