TEST BENCH FOR DYNAMIC RANGE TESTING OF ADC

摘要

A built-in self-test (BIST) approach based on a direct digital frequency synthesizer (DDFS) for the dynamic range testing of ADC is proposed. Testing analog components using spectral techniques requires a coherent sinusoidal stimulus. The sinusoidal test stimulus is generated using a direct digital frequency synthesizer, which is based on a new novel approach of using extended Taylor series approximations. The merit of DDFS is that the output frequency can be precisely and rapidly manipulated under digital control. The BIST method aims at full dynamic characterization of an ADC under test (DUT), while maintaining low area overhead. A low complexity DDFS has been proposed in this paper and the design approach for BIST of ADC is discussed.