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Strongly Secure Scan Design Using Generalized Feed Forward Shift Registers

机译:使用广义前馈移位寄存器的高度安全的扫描设计

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摘要

In our previous work [12], [13], we introduced generalized feed-forward shift registers (GF~(2)SR, for short) to apply them to secure and testable scan design, where we considered the security problem from the viewpoint of the complexity of identifying the structure of GF~(2)SRs. Although the proposed scan design is secure in the sense that the structure of a GF~(2)SR cannot be identified only from the primary input/output relation, it may not be secure if part of the contents of the circuit leak out. In this paper, we introduce a more secure concept called strong security such that no internal state of strongly secure circuits leaks out, and present how to design such strongly secure GF~(2)SRs.
机译:在我们先前的工作[12],[13]中,我们介绍了广义前馈移位寄存器(简称GF〜(2)SR),将其应用于安全且可测试的扫描设计,从角度考虑了安全性问题。 GF〜(2)SRs结构鉴定的复杂性尽管从仅不能从主输入/输出关系中识别出GF_(2)SR的结构的意义上说,所提出的扫描设计是安全的,但是如果部分电路内容泄漏出去,它可能也不安全。在本文中,我们引入了一个更安全的概念,称为强安全性,这样就不会泄漏强安全电路的内部状态,并介绍如何设计这种强安全的GF〜(2)SR。

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