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Single error correction, double error detection and double adjacent error correction with no mis-correction code

机译:单错误纠正,双错误检测和双相邻错误纠正,没有错误纠正码

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References(10) Single error correction, double error detection and double adjacent error correction (SEC-DED-DAEC) code without mis-correction of double non-adjacent error is proposed to achieve high reliability protection against soft errors in on-chip memory systems. To eliminate mis-correction among information bits, the orthogonality of orthogonal Latin square codes is engrafted in the H-matrix of the proposed code. Experimental results show that there is no mis-correction for the proposed code and the overhead of implementation is lower than that of other SEC-DED-DAEC codes. The proposed SEC-DED-DAEC code is suitable for applications to on-chip memory with high reliability.
机译:参考文献(10)提出了单错误校正,双错误检测和双相邻错误校正(SEC-DED-DAEC)代码,而没有对双非相邻错误的错误校正,以实现针对片上存储系统中软错误的高可靠性保护。 。为了消除信息位之间的错误校正,将正交拉丁方码的正交性植入到所建议代码的H矩阵中。实验结果表明,所提出的代码没有错误校正,实现的开销比其他SEC-DED-DAEC代码要低。拟议的SEC-DED-DAEC代码适用于具有高可靠性的片上存储器。

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