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Uncertainty in CCD detectors with and without cooling devices when used for molecular fluorescence measurements

机译:用于分子荧光测量的带或不带冷却装置的CCD检测器的不确定度

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The performance of CCD detectors for fluorescence measurements is evaluated through uncertainty studies, mainly as a function of both the signal intensity and the detector temperature. Two CCD detectors, one furnished with a cooling device and the other without a cooling device, were used, and the results were compared. The dependence of uncertainty on the instrumental signal was evaluated simultaneously for both detectors at temperatures ranging between a?’23 and 23 ?°C. The tested detectors required temperature increments between 30 and 50 ?°C to double dark noise (the random part of dark current). The detector temperature affects uncertainty, but this is basically related to dark noise in fluorescence measurements. The consequence of this is that the temperature does not significantly affect the signal-to-noise ratio (S/N); thus, the presence of a cooling device does not significantly improvement the performance, and the limit of detection (LOD) does not depend strongly on the detector temperature. The quality of the two-dimensional array does affect uncertainty, the value of S/N, and the LOD. A good CCD detector can perform at a level similar to a spectrofluorometer furnished with a photomultiplier tube. Laboratory data are given to show how the three components of uncertainty (dark noise, shot noise and flicker noise) behave at different signal intensities and temperatures. Dark noise is the most important factor, shot noise has relevance only at high signal values, and flicker noise is practically irrelevant. The classical model of the dependence of S/N on the fluorescence signal is applied, and the uncertainty constants that govern the performance of the apparatus used are given.
机译:CCD检测器用于荧光测量的性能是通过不确定性研究评估的,主要是信号强度和检测器温度的函数。使用了两个CCD检测器,一个装有冷却装置,另一个没有冷却装置,并对结果进行了比较。在两个温度范围为23至23摄氏度之间的温度下,两个检测器同时评估了不确定度对仪器信号的依赖性。经过测试的探测器要求温度升高30至50°C,以使暗噪声(暗电流的随机部分)加倍。检测器温度会影响不确定度,但这基本上与荧光测量中的暗噪声有关。其结果是温度不会显着影响信噪比(S / N)。因此,冷却装置的存在不会显着改善性能,并且检测极限(LOD)并不强烈取决于检测器温度。二维阵列的质量确实会影响不确定性,S / N值和LOD。好的CCD检测器可以达到与配备有光电倍增管的分光荧光计相似的水平。给出了实验室数据,以显示不确定性的三个分量(暗噪声,散粒噪声和闪烁噪声)在不同的信号强度和温度下如何表现。暗噪声是最重要的因素,散粒噪声仅在高信号值时才有意义,而闪烁噪声实际上是不相关的。应用了信噪比对荧光信号的经典模型,并给出了控制所用设备性能的不确定性常数。

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