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Boundary breakdown time of ZnO varistors under nanosecond pulse current

机译:纳秒脉冲电流下ZnO压敏电阻的边界击穿时间

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Conductive properties of zinc oxide (ZnO) varistor ceramics depend on the boundary barrier structure. By using the photoconductivity switches (PCSS) technology, the boundary breakdown characteristics of ZnO varistors for nanosecond electric pulse response was measured under bias voltage 700 - 1600 V and the relationship between conductance and material structure was analyzed. Charging time of grain boundary capacitor was ~ 100 ns and shortened with the increase of the bias electric field. The barrier height of ZnO grain boundary was influenced by bias electric field and the grain boundary capacitance was changed accordingly. The calculating numerical results are in agreement with the measured values.
机译:氧化锌(ZnO)压敏电阻陶瓷的导电性能取决于边界势垒结构。通过使用光电导开关(PCSS)技术,在偏置电压700-1600 V下测量了纳秒级电脉冲响应的ZnO压敏电阻的边界击穿特性,并分析了电导率与材料结构之间的关系。晶界电容器的充电时间约为100 ns,随着偏置电场的增加而缩短。 ZnO晶界的势垒高度受偏置电场的影响,晶界电容也随之改变。计算结果与实测值吻合。

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