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首页> 外文期刊>ACS Omega >Ordered 2D Structure Formed upon the Molecular Beam Epitaxy Growth of Ge on the Silicene/Ag(111) Surface
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Ordered 2D Structure Formed upon the Molecular Beam Epitaxy Growth of Ge on the Silicene/Ag(111) Surface

机译:硅在硅/ Ag(111)表面上分子束外延生长形成的有序二维结构

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Growth of Ge by molecular beam epitaxy (MBE) on top of the silicene monolayer on the Ag(111) surface results in either a dispersed adlayer or a two-dimensional (2D) ordered structure depending on the silicene phase. Scanning tunneling microscopy (STM) images show that the ordered adsorbed Ge atoms on (3 × 3)_(Si) domains occupy a position directly on top of down atoms in the buckled silicene layer, similar to the adatom positions on the Ge(111)-c(2 × 8) surface. By contrast, no long-range ordering of Ge adatoms is observed on the domain, possibly partly because of the interference effects of the Ag substrate. Results herein suggest that the deposited Ge atoms tend to build an additional three-dimensional bulk layer on the silicene monolayer and that the growth of the 2D germanene/silicene heterostructure may not be achieved in a straightforward manner.
机译:Ge通过分子束外延(MBE)在Ag(111)表面上的硅单分子层顶部生长,会导致分散的原子层或二维(2D)有序结构,具体取决于硅相。扫描隧道显微镜(STM)图像显示(3×3)_(Si)域上有序吸附的Ge原子直接位于弯曲硅层中下原子顶部的位置,类似于Ge(111)上的原子位置)-c(2×8)曲面。相反,在该畴上未观察到Ge原子的长程有序,可能部分是由于Ag底物的干扰作用。本文的结果表明,所沉积的Ge原子倾向于在硅单层上建立额外的三维体层,并且可能无法以直接的方式实现2D锗/硅异质结构的生长。

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