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首页> 外文期刊>Advances in condensed matter physics >Structural, Electrical, and Optical Properties of PbTe Thin Films Prepared by Simple Flash Evaporation Method
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Structural, Electrical, and Optical Properties of PbTe Thin Films Prepared by Simple Flash Evaporation Method

机译:简单闪蒸法制备的PbTe薄膜的结构,电学和光学性质

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摘要

Lead telluride (PbTe) films have been prepared on glass substrates by flash evaporation method. Structure of the film is found to possess stable face-centered cubic (fcc) NaCl phase in which the grains predominantly grow in the direction of (200) plane. The calculated grain size was in the range 19 nm. The electrical resistivity as a function of temperature was measured using four-probe technique. The electrical conductivity was calculated, and the value is found to be from 67.11 to 344.82 S/cm in the temperature range 303–453 K. The value of mobility was evaluated, and it is found to be0.329×10-3 cm2·V−1 S−1. An optical study reveals that the PbTe thin films exhibit large blue shift. The optical constants such as absorption coefficient and refractive index have been estimated, and the results are discussed.
机译:通过闪蒸法在玻璃基板上制备了碲化铅(PbTe)薄膜。发现膜的结构具有稳定的面心立方(fcc)NaCl相,其中晶粒主要在(200)平面方向上生长。计算出的晶粒尺寸在19 nm范围内。使用四探针技术测量电阻率随温度的变化。计算出电导率,在303–453 K的温度范围内,其值为67.11至344.82 S / cm,评估了迁移率的值,其为0.329×10-3×cm2· V-1 S-1。光学研究表明,PbTe薄膜表现出较大的蓝移。估计了诸如吸收系数和折射率的光学常数,并讨论了结果。

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