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Effect of Deposition Pressure on the Microstructure and Optical Band Gap of Molybdenum Disulfide Films Prepared by Magnetron Sputtering

机译:沉积压力对磁控溅射制备二硫化钼薄膜微结构和带隙的影响

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MoS2 films were prepared via magnetron sputtering under different deposition pressures, and the effects of deposition pressure on the crystal structure, surface morphology, and optical properties of the resulting films were investigated. The results show that the crystallinity of the films first increases and then decreases with increasing pressure. The surface of the films prepared by magnetron sputtering is dense and uniform with few defects. The deposition pressure affects the grain size, surface morphology, and optical band gap of the films. The films deposited at a deposition pressure of 1 Pa revealed remarkable crystallinity, a 30.35 nm grain size, and a 1.67 eV optical band gap. Given the large electronegativity difference between MoS2 molecules and weak van der Waals forces between layers, the MoS2 films are prone to defects at different deposition pressures, causing the exciton energy near defects to decrease and the modulation of the surrounding band.
机译:通过磁控溅射在不同的沉积压力下制备MoS2薄膜,并研究了沉积压力对所得薄膜的晶体结构,表面形貌和光学性质的影响。结果表明,随着压力的增加,薄膜的结晶度先增加然后降低。通过磁控溅射制备的膜的表面致密且均匀,几乎没有缺陷。沉积压力影响薄膜的晶粒尺寸,表面形态和光学带隙。在1 Pa的沉积压力下沉积的薄膜显示出显着的结晶度,30.35 nm的晶粒尺寸和1.67 eV的光学带隙。鉴于MoS2分子之间的大电负性差异和层之间的范德华力弱,MoS2膜在不同的沉积压力下容易出现缺陷,从而导致缺陷附近的激子能量降低,从而导致周围带的调制。

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