首页> 外国专利> Method and apparatus for improved low pressure collimated magnetron sputter deposition of metal films

Method and apparatus for improved low pressure collimated magnetron sputter deposition of metal films

机译:改进的低压准直磁控溅射金属膜沉积的方法和装置

摘要

A method and apparatus are provided which increase the collimation of sputter deposited films by increasing the mean free path (MFP) of sputtered atoms so as to reduce redirecting collisions with the buffer gas. This is accomplished by reducing buffer gas pressure while employing mechanisms to maintain or increase plasma electron density so as to sustain the plasma in the absence of normally required gas pressure. A first mechanism used to permit reduced gas pressure is to provide gas flow directly to the immediate region of the plasma discharge rather than to another remote area of the sputter deposition chamber. A second mechanism used to permit reduced gas pressure is to provide an electron emitting source near the plasma discharge to increase the plasma electron density without requiring further ionization of buffer gas atoms. These two mechanisms can be used either alone or together, as desired, in view of the circumstances presented.
机译:提供了一种方法和设备,该方法和设备通过增加溅射原子的平均自由程(MFP)来增加溅射沉积膜的准直度,从而减少与缓冲气体的重定向碰撞。这是通过降低缓冲气体压力,同时采用维持或增加等离子体电子密度的机制来实现的,从而在没有正常要求的气体压力的情况下维持等离子体。用于允许降低的气压的第一机制是将气流直接提供给等离子体放电的直接区域,而不是提供给溅射沉积室的另一个远端区域。用于允许降低气压的第二种机制是在等离子放电附近提供电子发射源,以增加等离子电子密度,而无需使缓冲气体原子进一步电离。考虑到所呈现的情况,这两种机制可以根据需要单独使用或一起使用。

著录项

  • 公开/公告号EP0790329A1

    专利类型

  • 公开/公告日1997-08-20

    原文格式PDF

  • 申请/专利权人 VARIAN ASSOCIATES INC.;

    申请/专利号EP19970300456

  • 发明设计人 BIBERGER MAXIMILIAN;CONCI DENNIS;

    申请日1997-01-24

  • 分类号C23C14/35;H01L21/203;

  • 国家 EP

  • 入库时间 2022-08-22 03:19:24

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