Investigations on physical properties of nanostructured ZnTe thin films prepared by DC reactive magnetron sputtering

摘要

Nanostructured ZnTe thin films were deposited on glass substrates by DC reactive magnetron sputtering technique. The depositions were carried out by varying the substrate temperature from RT to 350 o C. X-ray diffraction patterns shows that ZnTe thin films are polycrystalline in nature with cubic structure showing preferred orientation in (1 1 1) direction. The crystallite size and the intensity of XRD peaks increases with the increase of substrate temperature which implies better crystallinity takes place at higher temperature. The electrical resistivity of the films decreases with the increase of substrate temperature. The optical band gap values of ZnTe thin films are varied from 2.35 to 2.61 eV with the increase of substrate temperature and refractive index of the films are decreased from 2.90 to 2.66 with the increase of substrate temperature.