Bismuth selenide thin films were deposited thermally on to well cleaned glass substrates at a pressure of 10-6torr. Thickness of the samples were determined using quartz crystal monitor and it was found to be 320 nm. Structure of the samples were analyzed using Shimadzu 6000 X-ray diffractometer(XRD). The diffraction pattern revealed the microcrystalline nature of the film with hexagonal structure. From the diffractogram, microstructural and the lattice parameters were calculated. Surface morphology of the film was determined using scanning electron microscopy(SEM). on the basis of transmission spectra obtained in the wavelength range of 400 – 2500 nm, type of transition and band gap of the films were estimated
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