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Advanced microstructure diagnostics and interface analysis of modern materials by high-resolution analytical transmission electron microscopy

机译：高分辨率分析透射电子显微镜对现代材料进行先进的微结构诊断和界面分析

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《Bulletin of the Polish Academy of Sciences. Technical Sciences》 |2010年第2期|共页
作者
A. Mogilatenko; Ch. Zheng; H. Kirmse; I. H?usler; W. Hetaba; W. Neumann;
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1. Advanced microstructure diagnostics and interface analysis of modern materials by high-resolution analytical transmission electron microscopy [J] . W. NEUMANN, H. KIRMSE, I. HAUSLER Bulletin of the Polish Academy of Sciences. Technical Sciences . 2010,第2期

机译：高分辨率分析透射电子显微镜对现代材料进行先进的微结构诊断和界面分析
2. Advanced microstructure diagnostics and interface analysis of modern materials by high-resolution analytical transmission electron microscopy [J] . W. NeumannInstitute of Physics Humboldt University of Berlin Newtonstrasse 15 12489 Berlin GermanyOther articles by this author:De Gruyter OnlineGoogle Scholar, H. KirmseInstitute of Physics Humboldt University of Berlin Newtonstrasse 15 12489 Berlin GermanyOther articles by this author:De Gruyter OnlineGoogle Scholar, I. H?uslerInstitute of Physics Humboldt University of Berlin Newtonstrasse 15 12489 Berlin GermanyOther articles by this author:De Gruyter OnlineGoogle Scholar, Bulletin of the Polish Academy of Sciences. Technical Sciences . 2010,第2期

机译：高分辨率分析透射电子显微镜对现代材料进行先进的微结构诊断和界面分析
3. Investigation of the structure and composition of a {111} incoherent Zr/ZrN interface containing ledges by high-resolution transmission electron microscopy, image simulation, electron energy-loss spectroscopy, energy-filtering transmission electron microscopy, and near-coincidence-site analysis [J] . P. Li, J. M. Howe, W. T. Reynolds Jr. Metallurgical and Materials Transactions A . 2006,第3期

机译：高分辨率透射电子显微镜，图像模拟，电子能量损失谱，能量过滤透射电子显微镜和近符合现场分析法研究包含壁架的{111}非相干Zr / ZrN界面的结构和组成
4. ADVANCED TRANSMISSION ELECTRON MICROSCOPY ON MICROSTRUCTURES AND DOMAIN STRUCTURES OF MAGNETIC MATERIALS [C] . Daisuke Shindo, Young-Gil Park, Yoshitaka Aoyama Annual international conference on composites engineering . 2001

机译：高级透射电子显微镜在磁性材料的微观结构和畴结构上
5. III-V compound semiconductor material characterization of microstructures and nanostructures on various optoelectronic devices with analytical transmission electron microscopy and high resolution electron microscopy . [D] . Zhou, Wei. 2004

机译：III-V型化合物半导体材料表征的各种光电子器件的微结构和纳米结构的分析透射电子显微镜和高分辨率电子显微镜。
6. Analyzing the microstructure and related properties of 2D materials by transmission electron microscopy [O] . Yun-Yeong Chang, Heung Nam Han, Miyoung Kim 2019

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机译：siC纤维增强玻璃陶瓷中的反应层界面：高分辨率扫描透射电子显微镜分析

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