首页> 外文期刊>Bulletin of materials science >Eco-friendly method to synthesize and characterize 2D nanostructured (1,2-bis(diphenyl-phosphino)ethyl) tungsten tetracarbonyl methyl red/copper oxide di-layer thin films
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Eco-friendly method to synthesize and characterize 2D nanostructured (1,2-bis(diphenyl-phosphino)ethyl) tungsten tetracarbonyl methyl red/copper oxide di-layer thin films

机译:合成和表征二维纳米结构的(1,2-双(二苯基-膦基)乙基)四羰基钨红/铜氧化物双层薄膜的环保方法

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摘要

Three-layer thicknesses ($T_1 = 50$, $T_2 = 75$ and $T_3 = 100$ nm) of 1,2-bis(diphenylphosphino)ethyl tungsten tetracarbonyl methyl red (DPE-W-MR) were deposited onto the CuO thin film (50 nm) to produce DPE-W-MR/CuOdi-layer thin films by sola??gel spin-coating technique. The composition and the chemical structure of the as-prepared thin films were characterized using various techniques including elemental analysis, Fourier transform infrared spectroscopy,${}^1$H-NMR and X-ray diffraction (XRD). Scanning electron microscopy was used to investigate the size and shape of the CuO nanoparticles and the fabricated thin films. The films are crystalline as evidenced by the XRD pattern and DPE-W-MR has an orthorhombic crystal system. The crystallite size was calculated from an analysis of the line broadening features using theScherrer formula; the average crystallite sizes of DPE-W-MR/CuO di-layer thin films are 52.92, 56.24 and 72.26 nm for $T_1$, $T_2$ and $T_3$, respectively. Thermogravimetric analysis and the thermal curve of DPE-W-MR complex were studied. Optical properties of DPE-W-MR/CuO di-layer thin films are discussed. The optical band gap energies of DPE-W-MR di-layer thin films/CuO decreased (2.25, 2.1 and 1.88 eV) as the film thickness increased (from $T_1$ to $T_3$). Based on the optical results and the quantum confinement effects, the DPE-W-MR/CuO di-layer thin films may be candidates as semiconductor materialsfor optoelectronic devices.
机译:在CuO上沉积三层厚度为($ T_1 = 50 $,$ T_2 = 75 $和$ T_3 = 100nm)的1,2-双(二苯基膦基)乙基四羰基甲基钨红(DPE-W-MR)薄膜(50nm)通过溶胶凝胶旋涂技术生产DPE-W-MR / CuOdi层薄膜。使用各种技术,包括元素分析,傅立叶变换红外光谱,$ {} ^ 1 $ H-NMR和X射线衍射(XRD),对所制备薄膜的组成和化学结构进行表征。扫描电子显微镜用于研究CuO纳米粒子和制成的薄膜的尺寸和形状。如X射线衍射图所示,该膜是结晶的,并且DPE-W-MR具有正交晶系的晶体。通过使用Scherrer公式,通过对线展宽特征的分析来计算微晶尺寸。 DPE-W-MR / CuO双层薄膜的平均微晶尺寸分别为$ T_1 $,$ T_2 $和$ T_3 $分别为52.92、56.24和72.26 nm。研究了DPE-W-MR配合物的热重分析和热曲线。讨论了DPE-W-MR / CuO双层薄膜的光学性质。随着薄膜厚度的增加,DPE-W-MR双层薄膜/ CuO的光学带隙能量降低(2.25、2.1和1.88 eV)(从$ T_1 $到$ T_3 $)。基于光学结果和量子限制效应,DPE-W-MR / CuO双层薄膜可以作为光电子器件的半导体材料。

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