Algorithms for automatic test-pattern generation

摘要

Three well-known algorithms for the automatic test pattern generation (ATPG) for digital circuits are the D algorithm, Podem, and Fan. The author introduces the concept of test generation and analyzes the way each algorithm uses search and backtracking techniques to sensitize a fault and propagate it to an observable point. The heuristics used to guide ATPG search and the notation used to represent circuit values are examined.